益处-迈向未来ATE的一步

Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference Pub Date : 1992-09-21 DOI:10.1109/AUTEST.1992.270140

W. Ross, J.L. Hernandez

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引用次数: 1

摘要

作者讨论了概念验证工作的结果，旨在定义一个自动测试设备(ATE)架构，该架构结合了内置测试(BIT)数据和功能测试技术。这个概念被称为BENeFITS (BIT- enhanced Functional Test System)，它使用故障引导分析技术来处理从被测单元检索到的BIT故障数据，并仅在BIT指示的部分执行功能测试。其他功能包括使用软件算法和人工智能(AI)原理来提高故障标注的准确性。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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BENeFITS - A step to ATE of the future

The authors discuss the results of a proof-of-concept effort aimed at defining an automatic test equipment (ATE) architecture that incorporates both built-in-test (BIT) data and functional testing techniques. The concept, called BENeFITS (BIT-Enhanced Functional Test System), uses fault guided analysis techniques to process BIT failure data retrieved from the unit under test and perform functional testing only on the sections indicated by BIT. Other features include the use of software algorithms and artificial intelligence (AI) principles to improve fault callout accuracies over time.<>

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Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference

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