设计规则检查的扫描线方法:计算经验

P. Chapman, K. Clark
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引用次数: 10

摘要

在过去的几年里,集成电路技术的进步导致了设计的复杂性和密度不断增加。因此,设计师一直面临着对形状轮廓每一两年翻一番的设计进行设计规则检查的问题。作为回应,我们最近将有效的算法纳入我们的设计检查策略中。本文报道了这些努力的计算结果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The Scan Line Approach to Design Rules Checking: Computational Experiences
Advances in integrated circuit technology in the last several years have led to designs with ever-increasing complexity and density. Consequently, designers have been faced with performing design-rule-checking on designs with shape outlines that have been doubling in number every year or two. In response, we have recently incorporated efficient algorithms into our design checking strategy. This paper reports on the computational results of these efforts.
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