B. Damiani, R. Ludemann, D. Ruby, S. H. Zaidi, A. Rohatgi
{"title":"rie -织构硅太阳能电池的发展","authors":"B. Damiani, R. Ludemann, D. Ruby, S. H. Zaidi, A. Rohatgi","doi":"10.1109/PVSC.2000.915843","DOIUrl":null,"url":null,"abstract":"A maskless plasma texturing technique using reactive ion etching (RIE) for silicon solar cells results in a very low reflectance of 5.4% before, and 3.9% after SiN deposition. A detailed study of surface recombination and emitter properties was made, then solar cells were fabricated using the DOSS solar cell process. Different plasma-damage removal treatments are tested to optimize low lifetime solar cell efficiencies. Highest efficiencies are observed for little or no plasma-damage removal etching on mc-Si. Increased J/sub sc/ due to the RIE texture proved superior to a single layer anti-reflection coating. This indicates that RIE texturing is a promising texturing technique, especially applicable on lower lifetime (multicrystalline) silicon. The use of nontoxic, noncorrosive SF/sub 6/ makes this process attractive for mass production.","PeriodicalId":139803,"journal":{"name":"Conference Record of the Twenty-Eighth IEEE Photovoltaic Specialists Conference - 2000 (Cat. No.00CH37036)","volume":"116 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"25","resultStr":"{\"title\":\"Development of RIE-textured silicon solar cells\",\"authors\":\"B. Damiani, R. Ludemann, D. Ruby, S. H. Zaidi, A. Rohatgi\",\"doi\":\"10.1109/PVSC.2000.915843\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A maskless plasma texturing technique using reactive ion etching (RIE) for silicon solar cells results in a very low reflectance of 5.4% before, and 3.9% after SiN deposition. A detailed study of surface recombination and emitter properties was made, then solar cells were fabricated using the DOSS solar cell process. Different plasma-damage removal treatments are tested to optimize low lifetime solar cell efficiencies. Highest efficiencies are observed for little or no plasma-damage removal etching on mc-Si. Increased J/sub sc/ due to the RIE texture proved superior to a single layer anti-reflection coating. This indicates that RIE texturing is a promising texturing technique, especially applicable on lower lifetime (multicrystalline) silicon. The use of nontoxic, noncorrosive SF/sub 6/ makes this process attractive for mass production.\",\"PeriodicalId\":139803,\"journal\":{\"name\":\"Conference Record of the Twenty-Eighth IEEE Photovoltaic Specialists Conference - 2000 (Cat. No.00CH37036)\",\"volume\":\"116 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"25\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Record of the Twenty-Eighth IEEE Photovoltaic Specialists Conference - 2000 (Cat. No.00CH37036)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PVSC.2000.915843\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record of the Twenty-Eighth IEEE Photovoltaic Specialists Conference - 2000 (Cat. No.00CH37036)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.2000.915843","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A maskless plasma texturing technique using reactive ion etching (RIE) for silicon solar cells results in a very low reflectance of 5.4% before, and 3.9% after SiN deposition. A detailed study of surface recombination and emitter properties was made, then solar cells were fabricated using the DOSS solar cell process. Different plasma-damage removal treatments are tested to optimize low lifetime solar cell efficiencies. Highest efficiencies are observed for little or no plasma-damage removal etching on mc-Si. Increased J/sub sc/ due to the RIE texture proved superior to a single layer anti-reflection coating. This indicates that RIE texturing is a promising texturing technique, especially applicable on lower lifetime (multicrystalline) silicon. The use of nontoxic, noncorrosive SF/sub 6/ makes this process attractive for mass production.