{"title":"电磁兼容中FDTD的建模限制","authors":"F. Tristant, F. Torrès, A. Reineix, B. Jecko","doi":"10.1109/ISEMC.1999.812953","DOIUrl":null,"url":null,"abstract":"This paper describes the insightful and critical analysis of the validation methods used to check the results obtained with the finite difference time domain (FDTD) method in EMC modeling. The paper investigates both the limitations of this method and the solutions used to overcome these drawbacks.","PeriodicalId":312828,"journal":{"name":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","volume":"137 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Modeling limits of the FDTD in EMC\",\"authors\":\"F. Tristant, F. Torrès, A. Reineix, B. Jecko\",\"doi\":\"10.1109/ISEMC.1999.812953\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the insightful and critical analysis of the validation methods used to check the results obtained with the finite difference time domain (FDTD) method in EMC modeling. The paper investigates both the limitations of this method and the solutions used to overcome these drawbacks.\",\"PeriodicalId\":312828,\"journal\":{\"name\":\"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)\",\"volume\":\"137 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1999-08-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1999.812953\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1999 IEEE International Symposium on Electromagnetic Compatability. Symposium Record (Cat. No.99CH36261)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1999.812953","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper describes the insightful and critical analysis of the validation methods used to check the results obtained with the finite difference time domain (FDTD) method in EMC modeling. The paper investigates both the limitations of this method and the solutions used to overcome these drawbacks.