Experimental Verification of a Ultra-Low Voltage Charge Pump

This paper deals with the analysis of a cross coupled charge pump designed in a 130 nm CMOS technology with ultra low power supply voltage. We propose a printed circuit board, designed to experimentally verify this integrated circuit. The test board was designed to verify all function blocks of the charge pump independently, as well as the charge pump circuit as a whole. The charge pump was designed to operate at a supply voltage of 200 mV and the switching frequency of 100 kHz. The achieved experimental results prove the correct functionality of the designed charge pump integrated circuit.