双极晶体管辐射损伤对电流增益的剂量率依赖性测量

1998 IEEE Nuclear Science Symposium Conference Record. 1998 IEEE Nuclear Science Symposium and Medical Imaging Conference (Cat. No.98CH36255) Pub Date : 1998-11-08 DOI:10.1109/NSSMIC.1998.775155

D. Dorfan, T. Dubbs, A. Grillo, W. Rowe, H. Sadrozinski, A. Seiden, E. Spencer, S. Stromberg, R. Wichmann, N. Ipe, S. Mao

{"title":"双极晶体管辐射损伤对电流增益的剂量率依赖性测量","authors":"D. Dorfan, T. Dubbs, A. Grillo, W. Rowe, H. Sadrozinski, A. Seiden, E. Spencer, S. Stromberg, R. Wichmann, N. Ipe, S. Mao","doi":"10.1109/NSSMIC.1998.775155","DOIUrl":null,"url":null,"abstract":"We report the study of radiation induced change in the current gain of bipolar transistors for three different gamma dose rates. The dose rates differed by a factor of 60 with the lowest close to that anticipated for the LHC, and the highest at a rate we have been routinely using for radiation damage tests. The maximum dose attained was 200 kRad, which is high enough to compare with other measurements. The importance of annealing to high dose rate data is demonstrated.","PeriodicalId":129202,"journal":{"name":"1998 IEEE Nuclear Science Symposium Conference Record. 1998 IEEE Nuclear Science Symposium and Medical Imaging Conference (Cat. No.98CH36255)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-11-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Measurement of dose rate dependence of radiation induced damage to the current gain in bipolar transistors\",\"authors\":\"D. Dorfan, T. Dubbs, A. Grillo, W. Rowe, H. Sadrozinski, A. Seiden, E. Spencer, S. Stromberg, R. Wichmann, N. Ipe, S. Mao\",\"doi\":\"10.1109/NSSMIC.1998.775155\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We report the study of radiation induced change in the current gain of bipolar transistors for three different gamma dose rates. The dose rates differed by a factor of 60 with the lowest close to that anticipated for the LHC, and the highest at a rate we have been routinely using for radiation damage tests. The maximum dose attained was 200 kRad, which is high enough to compare with other measurements. The importance of annealing to high dose rate data is demonstrated.\",\"PeriodicalId\":129202,\"journal\":{\"name\":\"1998 IEEE Nuclear Science Symposium Conference Record. 1998 IEEE Nuclear Science Symposium and Medical Imaging Conference (Cat. No.98CH36255)\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-11-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1998 IEEE Nuclear Science Symposium Conference Record. 1998 IEEE Nuclear Science Symposium and Medical Imaging Conference (Cat. No.98CH36255)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSSMIC.1998.775155\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1998 IEEE Nuclear Science Symposium Conference Record. 1998 IEEE Nuclear Science Symposium and Medical Imaging Conference (Cat. No.98CH36255)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSSMIC.1998.775155","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 9

摘要

我们报告了三种不同剂量率下双极晶体管电流增益的辐射诱导变化的研究。剂量率相差60倍，最低的接近LHC的预期剂量率，最高的是我们通常用于辐射损伤试验的剂量率。获得的最大剂量为200克拉，与其他测量值相比，这已经足够高了。证明了退火对高剂量率数据的重要性。

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Measurement of dose rate dependence of radiation induced damage to the current gain in bipolar transistors

We report the study of radiation induced change in the current gain of bipolar transistors for three different gamma dose rates. The dose rates differed by a factor of 60 with the lowest close to that anticipated for the LHC, and the highest at a rate we have been routinely using for radiation damage tests. The maximum dose attained was 200 kRad, which is high enough to compare with other measurements. The importance of annealing to high dose rate data is demonstrated.

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来源期刊

1998 IEEE Nuclear Science Symposium Conference Record. 1998 IEEE Nuclear Science Symposium and Medical Imaging Conference (Cat. No.98CH36255)

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