论软件规格说明过程中偏差和缺陷的本质

Pablo A. Straub, M. Zelkowitz
{"title":"论软件规格说明过程中偏差和缺陷的本质","authors":"Pablo A. Straub, M. Zelkowitz","doi":"10.1109/CMPSAC.1992.217609","DOIUrl":null,"url":null,"abstract":"Implementation bias in a specification is an arbitrary constraint in the solution space. The authors describe the problem of bias and then present a model of the specification and design processes describing individual subprocesses in terms of precision/detail programs, and a model of bias in multi-attribute software specifications. While studying how bias is introduced into a specification it was realized that software defects and bias are dual problems of a single phenomenon. This has been used to explain the large proportion of faults found during the coding phase at the Software Engineering Laboratory at NASA Goddard Space Flight Center.<<ETX>>","PeriodicalId":286518,"journal":{"name":"[1992] Proceedings. The Sixteenth Annual International Computer Software and Applications Conference","volume":"294 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"On the nature of bias and defects in the software specification process\",\"authors\":\"Pablo A. Straub, M. Zelkowitz\",\"doi\":\"10.1109/CMPSAC.1992.217609\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Implementation bias in a specification is an arbitrary constraint in the solution space. The authors describe the problem of bias and then present a model of the specification and design processes describing individual subprocesses in terms of precision/detail programs, and a model of bias in multi-attribute software specifications. While studying how bias is introduced into a specification it was realized that software defects and bias are dual problems of a single phenomenon. This has been used to explain the large proportion of faults found during the coding phase at the Software Engineering Laboratory at NASA Goddard Space Flight Center.<<ETX>>\",\"PeriodicalId\":286518,\"journal\":{\"name\":\"[1992] Proceedings. The Sixteenth Annual International Computer Software and Applications Conference\",\"volume\":\"294 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-09-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"[1992] Proceedings. The Sixteenth Annual International Computer Software and Applications Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CMPSAC.1992.217609\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"[1992] Proceedings. The Sixteenth Annual International Computer Software and Applications Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CMPSAC.1992.217609","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10

摘要

规范中的实现偏差是解决方案空间中的任意约束。作者首先描述了偏差问题,然后提出了一个规范和设计过程的模型,以精确/详细程序的方式描述单个子过程,以及一个多属性软件规范中的偏差模型。在研究偏差如何引入规范的过程中,认识到软件缺陷和偏差是同一现象的双重问题。这被用来解释NASA戈达德太空飞行中心软件工程实验室在编码阶段发现的大部分故障。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
On the nature of bias and defects in the software specification process
Implementation bias in a specification is an arbitrary constraint in the solution space. The authors describe the problem of bias and then present a model of the specification and design processes describing individual subprocesses in terms of precision/detail programs, and a model of bias in multi-attribute software specifications. While studying how bias is introduced into a specification it was realized that software defects and bias are dual problems of a single phenomenon. This has been used to explain the large proportion of faults found during the coding phase at the Software Engineering Laboratory at NASA Goddard Space Flight Center.<>
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信