{"title":"提花织物疵点检测","authors":"Henry Y. T. Ngan, G. Pang, S. Yung, M. K. Ng","doi":"10.1109/AIPR.2003.1284266","DOIUrl":null,"url":null,"abstract":"The techniques for defect detection on plain (unpatterned) fabrics have been well developed nowadays. This paper is on developing visual inspection methods for defect detection on patterned fabrics. A review on some defect detection methods on patterned fabrics is given. Then, a new method for patterned fabric inspection called Golden Image Subtraction (GIS) is introduced. GIS is an efficient and fast method, which can segment out the defective regions on patterned fabric effectively. An improved version of the GIS method using wavelet transform is also given. This research results contribute to the development of an automated fabric inspection machine for the textile industry.","PeriodicalId":176987,"journal":{"name":"32nd Applied Imagery Pattern Recognition Workshop, 2003. Proceedings.","volume":"190 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-10-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"36","resultStr":"{\"title\":\"Defect detection on patterned jacquard fabric\",\"authors\":\"Henry Y. T. Ngan, G. Pang, S. Yung, M. K. Ng\",\"doi\":\"10.1109/AIPR.2003.1284266\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The techniques for defect detection on plain (unpatterned) fabrics have been well developed nowadays. This paper is on developing visual inspection methods for defect detection on patterned fabrics. A review on some defect detection methods on patterned fabrics is given. Then, a new method for patterned fabric inspection called Golden Image Subtraction (GIS) is introduced. GIS is an efficient and fast method, which can segment out the defective regions on patterned fabric effectively. An improved version of the GIS method using wavelet transform is also given. This research results contribute to the development of an automated fabric inspection machine for the textile industry.\",\"PeriodicalId\":176987,\"journal\":{\"name\":\"32nd Applied Imagery Pattern Recognition Workshop, 2003. Proceedings.\",\"volume\":\"190 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2003-10-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"36\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"32nd Applied Imagery Pattern Recognition Workshop, 2003. Proceedings.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/AIPR.2003.1284266\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"32nd Applied Imagery Pattern Recognition Workshop, 2003. Proceedings.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AIPR.2003.1284266","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The techniques for defect detection on plain (unpatterned) fabrics have been well developed nowadays. This paper is on developing visual inspection methods for defect detection on patterned fabrics. A review on some defect detection methods on patterned fabrics is given. Then, a new method for patterned fabric inspection called Golden Image Subtraction (GIS) is introduced. GIS is an efficient and fast method, which can segment out the defective regions on patterned fabric effectively. An improved version of the GIS method using wavelet transform is also given. This research results contribute to the development of an automated fabric inspection machine for the textile industry.
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