{"title":"垫打印机","authors":"G. Love, G. Maher, N. Long","doi":"10.1109/IEMT.1996.559721","DOIUrl":null,"url":null,"abstract":"We present the results of alpha-site testing of a pad printer for thick film technology, including uniformity, reproducibility, physical and electrical characterization of conductor and resistor patterns in single-layer (hybrid) configurations and in multi-layer co-fired designs.","PeriodicalId":177653,"journal":{"name":"Nineteenth IEEE/CPMT International Electronics Manufacturing Technology Symposium","volume":"420 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Pad printer\",\"authors\":\"G. Love, G. Maher, N. Long\",\"doi\":\"10.1109/IEMT.1996.559721\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present the results of alpha-site testing of a pad printer for thick film technology, including uniformity, reproducibility, physical and electrical characterization of conductor and resistor patterns in single-layer (hybrid) configurations and in multi-layer co-fired designs.\",\"PeriodicalId\":177653,\"journal\":{\"name\":\"Nineteenth IEEE/CPMT International Electronics Manufacturing Technology Symposium\",\"volume\":\"420 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Nineteenth IEEE/CPMT International Electronics Manufacturing Technology Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IEMT.1996.559721\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nineteenth IEEE/CPMT International Electronics Manufacturing Technology Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEMT.1996.559721","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
We present the results of alpha-site testing of a pad printer for thick film technology, including uniformity, reproducibility, physical and electrical characterization of conductor and resistor patterns in single-layer (hybrid) configurations and in multi-layer co-fired designs.