IDDq优势(数字CMOS测试)

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's Pub Date : 1991-04-15 DOI:10.1109/VTEST.1991.208172

Steven D. McEuen

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引用次数: 31

摘要

作者讨论了IDDq的许多不同方面，质量、可靠性和测试是主要的三个方面。对IDDq进行了描述，并给出了实现IDDq的不同实用方法。采用数字CMOS技术进行IDDq测试，用户得到的产品可靠性更高。介绍了这些优点，它们清楚地支持IDDq的实现。

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IDDq benefits (digital CMOS testing)

The author discusses many different aspects of IDDq, quality, reliability, and test being the major three. A description of IDDq is presented with different pragmatic methods of implementing it. Employing IDDq testing on digital CMOS technology, the user obtains a product with greater reliability. These benefits are introduced, which clearly support IDDq's implementation.<>

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来源期刊

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's

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