{"title":"FinFET技术中射频电路的全反转区gm/ID方法","authors":"R. Fiorelli, J. Núñez, F. Silveira","doi":"10.1109/NEWCAS.2018.8585627","DOIUrl":null,"url":null,"abstract":"In the context of IoT applications, together with the use of deep-submicron technologies as FinFET, this paper presents a revision of the gm/ID methodology for radio-frequency analog front-end circuits. Particularly, this methodology is applied for the design of LC-VCOs in the 5.8-GHz band using 20-nm FinFET transistors. To incorporate the FinFET model into the design flow, a semi-empirical model is extracted from electrical simulations. To show the good performance of the methodology, an LC-VCO design, picked from the calculated design maps, is electrically simulated, achieving good match regarding oscillation frequency and phase noise.","PeriodicalId":112526,"journal":{"name":"2018 16th IEEE International New Circuits and Systems Conference (NEWCAS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"All-inversion region gm/ID methodology for RF circuits in FinFET technologies\",\"authors\":\"R. Fiorelli, J. Núñez, F. Silveira\",\"doi\":\"10.1109/NEWCAS.2018.8585627\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In the context of IoT applications, together with the use of deep-submicron technologies as FinFET, this paper presents a revision of the gm/ID methodology for radio-frequency analog front-end circuits. Particularly, this methodology is applied for the design of LC-VCOs in the 5.8-GHz band using 20-nm FinFET transistors. To incorporate the FinFET model into the design flow, a semi-empirical model is extracted from electrical simulations. To show the good performance of the methodology, an LC-VCO design, picked from the calculated design maps, is electrically simulated, achieving good match regarding oscillation frequency and phase noise.\",\"PeriodicalId\":112526,\"journal\":{\"name\":\"2018 16th IEEE International New Circuits and Systems Conference (NEWCAS)\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 16th IEEE International New Circuits and Systems Conference (NEWCAS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NEWCAS.2018.8585627\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 16th IEEE International New Circuits and Systems Conference (NEWCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NEWCAS.2018.8585627","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
All-inversion region gm/ID methodology for RF circuits in FinFET technologies
In the context of IoT applications, together with the use of deep-submicron technologies as FinFET, this paper presents a revision of the gm/ID methodology for radio-frequency analog front-end circuits. Particularly, this methodology is applied for the design of LC-VCOs in the 5.8-GHz band using 20-nm FinFET transistors. To incorporate the FinFET model into the design flow, a semi-empirical model is extracted from electrical simulations. To show the good performance of the methodology, an LC-VCO design, picked from the calculated design maps, is electrically simulated, achieving good match regarding oscillation frequency and phase noise.