FinFET技术中射频电路的全反转区gm/ID方法

R. Fiorelli, J. Núñez, F. Silveira
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引用次数: 0

摘要

在物联网应用的背景下,结合使用深亚微米技术作为FinFET,本文提出了射频模拟前端电路的gm/ID方法的修订。特别是,该方法应用于使用20nm FinFET晶体管设计5.8 ghz频段的lc - vco。为了将FinFET模型整合到设计流程中,从电气仿真中提取了半经验模型。为了证明该方法的良好性能,从计算的设计图中选择一个LC-VCO设计进行了电模拟,在振荡频率和相位噪声方面实现了良好的匹配。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
All-inversion region gm/ID methodology for RF circuits in FinFET technologies
In the context of IoT applications, together with the use of deep-submicron technologies as FinFET, this paper presents a revision of the gm/ID methodology for radio-frequency analog front-end circuits. Particularly, this methodology is applied for the design of LC-VCOs in the 5.8-GHz band using 20-nm FinFET transistors. To incorporate the FinFET model into the design flow, a semi-empirical model is extracted from electrical simulations. To show the good performance of the methodology, an LC-VCO design, picked from the calculated design maps, is electrically simulated, achieving good match regarding oscillation frequency and phase noise.
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