CMOS时间-数字转换器,具有低PVT灵敏度20.8ps分辨率和- 0.25 ~ 0.22 LSB不精度

Poki Chen, Kai-Ming Wang, Chuan-Yuan Li, Po-Yu Chen, Juan-Shan Lai, Cheng-Wei Liu
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引用次数: 8

摘要

提出了一种简单但提高精度的基于脉冲拉伸插值器的CMOS时间-数字转换器(TDC)。不需要修改传统电路,不准确性和PVT(过程,电压和温度)灵敏度都大大降低。通过精确的器件尺寸消除了电荷注入和时钟馈通引起的误差。其脉冲拉伸器的电流和电容比的准确性通过二维共同质心布局来保证。采用台积电0.35µm标准CMOS工艺制造,在0 ~ 20ns输入范围内,时间分辨率可达到20.8ps, INL误差为- 0.25 ~ 0.22LSB。另外,20个封装芯片的分辨率仅在20.25 ~ 20.96ps之间。所有制造的芯片都经过测试,在- 40 ~ 120°C的温度工作范围和2.6 ~ 4.9V的电源电压范围下具有全功能,其温度漂移和电源电压灵敏度比其前身提高了约10倍。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
CMOS time-to-digital converter with low PVT sensitivity 20.8ps resolution and −0.25∼0.22 LSB inaccuracy
A simple but accuracy-enhanced CMOS time-to-digital converter (TDC) based on pulse stretcher interpolators is presented. Without the need of modifying the conventional circuit, both inaccuracy and PVT (process, voltage and temperature) sensitivity are substantially reduced. The errors caused by charge injection and clock feedthrough are eliminated by precise device sizing. The accuracy of current and capacitor ratios for its pulse stretchers is ensured by two-dimensional common centroid layouts. Fabricated in a TSMC 0.35µm standard CMOS process, the time resolution can be realized as 20.8ps and the INL error is proven to be −0.25∼0.22LSB for 0∼20ns input range. Moreover, the measured resolution merely spreads over 20.25∼20.96ps for twenty packaged chips. All fabricated chips were tested to be full functional under - 40∼120°C temperature operation range and 2.6∼4.9V supply voltage range with about ten-fold improvement in temperature drift and supply voltage sensitivity from its predecessor's.
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