{"title":"数字电子系统通用ESD测试方案","authors":"Ed Black","doi":"10.1109/ISEMC.1982.7567747","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":280076,"journal":{"name":"1982 IEEE International Symposium on Electromagnetic Compatibility","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1982-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Generalized ESD Testing Regimen for Digital Electronic Systems\",\"authors\":\"Ed Black\",\"doi\":\"10.1109/ISEMC.1982.7567747\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":280076,\"journal\":{\"name\":\"1982 IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1982-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1982 IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1982.7567747\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1982 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1982.7567747","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}