{"title":"用于多频单元阻抗测量的低功率电流模式斜坡ADC","authors":"Jinlong Gu, N. Mcfarlane","doi":"10.1109/MWSCAS.2012.6292195","DOIUrl":null,"url":null,"abstract":"We show the design of a current mode ramp analog to digital converter (ADC) in standard 0.13 μm, 1 poly, 8 metal CMOS process. The ADC is a low-power and area-saving solution for multi-frequency cell impedance measurement. It uses two-step conversion to boost the conversion time by a factor of 32, while keeping a constant practical clock frequency. The ramp ADC samples current signals at different frequencies and converts them into digital signals simultaneously. The main blocks of the ADC are current-mode ramp generator, current comparator, a delay locked loop (DLL) and a gray-code counter.","PeriodicalId":324891,"journal":{"name":"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)","volume":"108 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Low power current mode ramp ADC for multi-frequency cell impedance measurement\",\"authors\":\"Jinlong Gu, N. Mcfarlane\",\"doi\":\"10.1109/MWSCAS.2012.6292195\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We show the design of a current mode ramp analog to digital converter (ADC) in standard 0.13 μm, 1 poly, 8 metal CMOS process. The ADC is a low-power and area-saving solution for multi-frequency cell impedance measurement. It uses two-step conversion to boost the conversion time by a factor of 32, while keeping a constant practical clock frequency. The ramp ADC samples current signals at different frequencies and converts them into digital signals simultaneously. The main blocks of the ADC are current-mode ramp generator, current comparator, a delay locked loop (DLL) and a gray-code counter.\",\"PeriodicalId\":324891,\"journal\":{\"name\":\"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)\",\"volume\":\"108 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-09-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSCAS.2012.6292195\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE 55th International Midwest Symposium on Circuits and Systems (MWSCAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSCAS.2012.6292195","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Low power current mode ramp ADC for multi-frequency cell impedance measurement
We show the design of a current mode ramp analog to digital converter (ADC) in standard 0.13 μm, 1 poly, 8 metal CMOS process. The ADC is a low-power and area-saving solution for multi-frequency cell impedance measurement. It uses two-step conversion to boost the conversion time by a factor of 32, while keeping a constant practical clock frequency. The ramp ADC samples current signals at different frequencies and converts them into digital signals simultaneously. The main blocks of the ADC are current-mode ramp generator, current comparator, a delay locked loop (DLL) and a gray-code counter.