用于分析数字器件的测试输入的建模方法

2014 2nd 2014 2nd International Conference on Emission Electronics (ICEE) Pub Date : 2014-09-08 DOI:10.1109/EMISSION.2014.6893969

V. Melnik, Alexander N. Mikhailov, V. Grishkin, D. Ovsyannikov, Yevgeny V. Yelaev

{"title":"用于分析数字器件的测试输入的建模方法","authors":"V. Melnik, Alexander N. Mikhailov, V. Grishkin, D. Ovsyannikov, Yevgeny V. Yelaev","doi":"10.1109/EMISSION.2014.6893969","DOIUrl":null,"url":null,"abstract":"The test check of complex digital devices is a difficult problem. The computer-aided design system (CAD) “SimTest” was developed so as to automate the process of digital device test-program making.","PeriodicalId":314830,"journal":{"name":"2014 2nd 2014 2nd International Conference on Emission Electronics (ICEE)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-09-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Modeling methods of the test inputs for analysis the digital devices\",\"authors\":\"V. Melnik, Alexander N. Mikhailov, V. Grishkin, D. Ovsyannikov, Yevgeny V. Yelaev\",\"doi\":\"10.1109/EMISSION.2014.6893969\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The test check of complex digital devices is a difficult problem. The computer-aided design system (CAD) “SimTest” was developed so as to automate the process of digital device test-program making.\",\"PeriodicalId\":314830,\"journal\":{\"name\":\"2014 2nd 2014 2nd International Conference on Emission Electronics (ICEE)\",\"volume\":\"34 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-09-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 2nd 2014 2nd International Conference on Emission Electronics (ICEE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMISSION.2014.6893969\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 2nd 2014 2nd International Conference on Emission Electronics (ICEE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMISSION.2014.6893969","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 1

摘要

复杂数字器件的测试检测是一个难题。开发了计算机辅助设计系统“SimTest”，实现了数字器件测试程序编制的自动化。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Modeling methods of the test inputs for analysis the digital devices

The test check of complex digital devices is a difficult problem. The computer-aided design system (CAD) “SimTest” was developed so as to automate the process of digital device test-program making.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2014 2nd 2014 2nd International Conference on Emission Electronics (ICEE)

自引率

0.00%

发文量