柔性存储器件用铁电聚合物薄膜

M. Micjan, J. Nevrela, M. Novota, S. Flickyngerová, P. Juhasz, J. Uhrik, J. Jakabovic, M. Weis
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引用次数: 0

摘要

在这里,我们展示了有机铁电绝缘材料:共聚物偏氟乙烯和三氟乙烯P(VDF-TrFE)在有机存储器件中的应用。金属-绝缘体-金属结构已被用来研究铁电特性,并代表了铁电场效应晶体管(fefet)和铁电随机存取存储器(FRAM)的模型应用。分析了薄膜结构中存在的铁电开关现象的电流-电压和电容-电压特性以及极化特性。本工作描述了MIM器件的制造技术以及材料性能的评估:饱和极化、最大电场强度、临界电场和相对介电常数。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Ferroelectric polymer films for flexible memory devices
Here we demonstrate application of organic ferroelectric insulating material: copolymer vinylidene fluoride and trifluoroethylene P(VDF-TrFE) for organic memory devices. The metal-insulator-metal structures have been used to study the ferroelectric properties and represent the model applications for ferroelectric field-effect transistors (FeFETs) and ferroelectric random access memories (FRAM). The current-voltage and capacitance-voltage characteristics depicted ferroelectric switching phenomenon present in thin-film structures and polarization properties have been analysed. This work describes the MIM device fabrication technology as well as the evaluation of material properties: saturated polarization, maximum electric field intensity, critical electric field, and relative dielectric constant.
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