考虑HCI可靠性的60GHz CMOS收发器

2015 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT) Pub Date : 2015-08-01 DOI:10.1109/RFIT.2015.7377874

K. Okada

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引用次数: 1

摘要

本文提出了一种基于65nm CMOS的60GHz无线收发器的热载流子注入(HCI)修复技术。收发器可进行16QAM无线通信，数据速率为7Gb/s。通过hci修复技术，可以将损坏的输出功率恢复到7.8dBm，并实现81年的使用寿命。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A 60GHz CMOS transceiver considering HCI reliability

This paper presents a hot-carrier injection (HCI) healing technique with a 60GHz wireless transceiver in 65nm CMOS. The transceiver is capable of 16QAM wireless communication with a data rate of 7Gb/s. The damaged output power can be recovered to 7.8dBm by the proposed HCI-healing technique, and an 81-year lifetime is achieved.

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来源期刊

2015 IEEE International Symposium on Radio-Frequency Integration Technology (RFIT)

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