基于故障分布的复杂备件存储器冗余分析

Hayoung Lee, Donghyun Han, Seungtaek Lee, Sungho Kang
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引用次数: 0

摘要

随着存储密度和容量的不断提高,冗余分析(RA)被广泛应用于提高存储良率。然而,随着存储器故障发生概率的增加,具有简单备用结构的传统RAs的修复率已不足以达到较高的存储器产量。针对这一问题,提出了基于故障分布的存储器冗余分析方法。通过使用复杂的备件,可以获得比传统的具有简单备件结构的ra更高的修理率。此外,虽然使用复杂的备件会增加分析时间,但RAFD通过考虑故障分布,解决了备件顺序分配的问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Redundancy Analysis based on Fault Distribution for Memory with Complex Spares
With the development of memory density and capacity, a redundancy analysis (RA) is widely used to improve memory yield. However, as the probability of fault occurrence on memory increases, repair rates of conventional RAs with a simple spare structure have been not enough to achieve a high memory yield. In this paper, redundancy analysis based on fault distribution (RAFD) for memory with complex spares is proposed to address the problem. It can obtain much higher repair rate than using conventional RAs with a simple spare structure by using complex spares. Also, although use of complex spares can cause analysis time increase but, RAFD solves the problem with the sequential spare allocations through consideration of fault distribution.
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