利用MEMS谐振结构进行纳米精密力和位移测量

E. Mehdizadeh, Xiaobo Guo, S. Pourkamali, A. Hajjam, A. Rahafrooz
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引用次数: 4

摘要

这项工作提出了一种利用MEMS谐振器测量亚纳米牛顿力和亚皮米位移的新方法。不同版本的热致动双板微机械谐振器与静电致动器耦合,用作高灵敏度的力/位移传感器。执行器产生的力使相关谐振器应变,从而改变其谐振频率。经过彻底的表征,这种方法可以作为微纳米机电系统中力和位移测量的可靠和准确的解决方案。所述结构的频率-力和位移灵敏度分别高达17Hz/nN和540 Hz/pm,显示了这种装置在亚纳米级力和位移测量分辨率方面的潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Nano-precision force and displacement measurements using MEMS resonant structures
This work presents a new approach for measuring sub-nano-Newton forces and sub-picometer displacements using MEMS resonators. Different versions of thermally actuated dual plate micromechanical resonators coupled to electrostatic actuators are utilized as highly sensitive force/displacement sensors. The force generated by the actuator strains the associated resonator changing its resonant frequency. Upon thorough characterization, this approach can be used as a reliable and accurate solution for force and displacement measurements in micro and nano-electromechancial systems. Frequency-force and displacement sensitivities as high as 17Hz/nN and 540 Hz/pm have been measured for the presented structures, respectively, showing the potential of such devices for sub-nanoscale force and displacement measurement resolutions.
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