二元η-μ复衰落模型

2019 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference (IMOC) Pub Date : 2019-11-10 DOI:10.1109/IMOC43827.2019.9317626

Alessandro P. de Oliveira, Thiago A. M. de Bairros, M. Yacoub, R. D. de Souza

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引用次数: 1

摘要

本文提出了二元η-μ复过程的衰落模型。得到了包含两个包络和两相的联合概率密度函数的精确的、封闭的表达式。所提出的模型构成了一个框架，该框架可用于评估存在一般衰落模型的无线通信系统的性能。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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A Bivariate η-μ Complex Fading Model

In this paper, a fading model for the bivariate η-μ complex process is proposed. An exact, closed-form expression for the joint probability density function including the two envelopes and the two phases is attained. The proposed model constitutes a framework that can be used to assess the performance of wireless communications systems in the presence of a general fading model.

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来源期刊

2019 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference (IMOC)

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