低欧姆厚膜电阻器的脉冲稳定性

A. Dąbrowski, Jakub Czarachowicz, A. Dziedzic
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引用次数: 0

摘要

介绍了低欧姆厚膜电阻器在微、毫秒脉冲负载下的耐久性。标准厚膜电阻组合物,片电阻为10欧姆/平方(4311和QS871) -杜邦;测试了R400-10A - Heraus)和3欧姆/平方(QS870 - DuPont)。在氧化铝衬底上制备了电阻为3 Ω的测试电阻器。在每种电压下50次脉冲后测量电阻变化。然后增加电压,重复一系列脉冲,直到电阻变化超过0.5%。当衬底和散热器之间的热界面被导热润滑脂填充时,由4311浆料制成的电阻器在长(20 ms)脉冲下表现出最高的耐用性。在19 W/mm2左右和18 W/mm2左右,覆釉和未覆釉试样的相对电阻变化为+0.5%。短脉冲(微秒)对QS871浆料的影响最小,在电场强度约为90±10 V/mm时,浆料的电阻变化为+0.5%。4311膏体的参数最大值为50±10 V/mm,而R400-10和QS870膏体的参数值不超过40±10 V/mm。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Pulse stability of low ohmic thick-film resistors
Durability of low ohmic thick-film resistors on pulse load with micro-and milisecond duration are described in this paper. Standard thick-film resistive compositions with sheet resistance of 10 Ohms/sq (4311 and QS871 — DuPont; R400-10A — Heraus) and 3 Ohms/sq (QS870 — DuPont) were tested. Test resistors with resistance of 3 Ω were prepared on alumina substrates. Resistance changes were measured after 50 pulses at each voltage. Then the voltage was increased and the series of pulses were repeated until the resistance change exceeded 0.5%. The resistors made of 4311 paste exhibited the highest durability for long (20 ms) pulses, when the thermal interface between substrate and heatsink was filled by thermally conductive grease. The relative resistance change of +0.5% was observed at about 19 W/mm2 and about 18 W/mm2 for the samples with and without the overglaze, respectively. Short (microsecond) pulses had the least influence on QS871 paste, for which the resistance change of +0.5% was observed at electric field intensity of about 90 ± 10 V/mm. For 4311 paste the parameter reached maximum 50 ± 10 V/mm, whereas for R400-10 as well as QS870 pastes the value didn't exceed 40 ± 10 V/mm.
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