二氧化硅一维声子晶体中拓扑保护弹性模的光弹性成像

2017 22nd Microoptics Conference (MOC) Pub Date : 2017-11-01 DOI:10.23919/MOC.2017.8244520

Ingi Kim, S. Iwamoto, Y. Arakawa

{"title":"二氧化硅一维声子晶体中拓扑保护弹性模的光弹性成像","authors":"Ingi Kim, S. Iwamoto, Y. Arakawa","doi":"10.23919/MOC.2017.8244520","DOIUrl":null,"url":null,"abstract":"We measure the spatial distribution of a topologically protected elastic modes in a silica 1D phononic crystal (PnC) by using the photoelasticity imaging technique. The strong localization of the topological elastic mode at the interface of two-joined PnCs with topologically distinct bandgaps is experimentally demonstrated.","PeriodicalId":123743,"journal":{"name":"2017 22nd Microoptics Conference (MOC)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Imaging of topologically protected elastic mode in silica 1D phononic crystal via photoelastic effect\",\"authors\":\"Ingi Kim, S. Iwamoto, Y. Arakawa\",\"doi\":\"10.23919/MOC.2017.8244520\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We measure the spatial distribution of a topologically protected elastic modes in a silica 1D phononic crystal (PnC) by using the photoelasticity imaging technique. The strong localization of the topological elastic mode at the interface of two-joined PnCs with topologically distinct bandgaps is experimentally demonstrated.\",\"PeriodicalId\":123743,\"journal\":{\"name\":\"2017 22nd Microoptics Conference (MOC)\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 22nd Microoptics Conference (MOC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/MOC.2017.8244520\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 22nd Microoptics Conference (MOC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/MOC.2017.8244520","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

利用光弹性成像技术测量了拓扑保护弹性模在硅一维声子晶体(PnC)中的空间分布。实验证明了具有不同带隙的双连接pnc界面上拓扑弹性模的强局域化。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Imaging of topologically protected elastic mode in silica 1D phononic crystal via photoelastic effect

We measure the spatial distribution of a topologically protected elastic modes in a silica 1D phononic crystal (PnC) by using the photoelasticity imaging technique. The strong localization of the topological elastic mode at the interface of two-joined PnCs with topologically distinct bandgaps is experimentally demonstrated.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2017 22nd Microoptics Conference (MOC)

自引率

0.00%

发文量