用于高粗样品的长尖AFM探针的制备

Hyen-Wook Kang, Y. Kawashima, H. Muramatsu
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引用次数: 0

摘要

一种用于AFM测量的长聚合物尖端已经被制造出来,它能够成像大而高度粗糙的物体,如生物和食品样品。双光子吸附光聚合技术提供了一个长聚合物尖端到商业悬臂。长聚合物尖端的长度为90µm。使用制备的长尖端对直径为~ 3µm的糙米粉进行成像。结果AFM图像清晰地显示出粗糙的表面,这是商用尖端无法接近的。由于制造的尖端具有锥形结构,因此可以获得清晰的糙米粉图像,而不会像商业金字塔形状的尖端成像那样出现尖锐的悬崖状图案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Fabrication of long tip AFM probes for highly coarse samples
A long polymeric tip has been fabricated for AFM measurements, which is able to image large and highly coarse objects such as biological and food samples. Two-photon adsorbed photo-polymerization technique provides a long polymeric tip onto a commercial cantilever. The length of the long polymeric tip was 90µm. Brown rice flours with ∼3µm diameter were imaged using the fabricated long tip. The result AFM image clearly showed coarse surface, which cannot be approached by a commercial tip. Since the fabricated tip has conical structure, a clear image of brown rice flours were achieved without sharp cliff-like patterns, which imaged by the commercial pyramidal shape tip.
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