{"title":"用于RFID应用的CMOS智能温度传感器","authors":"J. P. M. Brito, A. Rabaeijs","doi":"10.1109/SBCCI.2013.6644858","DOIUrl":null,"url":null,"abstract":"This paper presents an overview of the capabilities and different architectures for integrated temperature sensors in RFID tags using CMOS technology. A feasibility study for the integration of temperature sensors in RFID tags is described. The study focuses on four topologies to make temperature measurements and compare them regarding power, temperature range, accuracy, resolution and technology node. Measurement results of a test structure based on a potential proportional to absolute temperature (Vptat) fabricated in deep-submicron CMOS technology is presented and discussed.","PeriodicalId":203604,"journal":{"name":"2013 26th Symposium on Integrated Circuits and Systems Design (SBCCI)","volume":"101 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"CMOS smart temperature sensors for RFID applications\",\"authors\":\"J. P. M. Brito, A. Rabaeijs\",\"doi\":\"10.1109/SBCCI.2013.6644858\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an overview of the capabilities and different architectures for integrated temperature sensors in RFID tags using CMOS technology. A feasibility study for the integration of temperature sensors in RFID tags is described. The study focuses on four topologies to make temperature measurements and compare them regarding power, temperature range, accuracy, resolution and technology node. Measurement results of a test structure based on a potential proportional to absolute temperature (Vptat) fabricated in deep-submicron CMOS technology is presented and discussed.\",\"PeriodicalId\":203604,\"journal\":{\"name\":\"2013 26th Symposium on Integrated Circuits and Systems Design (SBCCI)\",\"volume\":\"101 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-10-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 26th Symposium on Integrated Circuits and Systems Design (SBCCI)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SBCCI.2013.6644858\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 26th Symposium on Integrated Circuits and Systems Design (SBCCI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SBCCI.2013.6644858","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
CMOS smart temperature sensors for RFID applications
This paper presents an overview of the capabilities and different architectures for integrated temperature sensors in RFID tags using CMOS technology. A feasibility study for the integration of temperature sensors in RFID tags is described. The study focuses on four topologies to make temperature measurements and compare them regarding power, temperature range, accuracy, resolution and technology node. Measurement results of a test structure based on a potential proportional to absolute temperature (Vptat) fabricated in deep-submicron CMOS technology is presented and discussed.