液晶介电特性在毫米和太赫兹范围内的测量

2010 INTERNATIONAL KHARKOV SYMPOSIUM ON PHYSICS AND ENGINEERING OF MICROWAVES, MILLIMETER AND SUBMILLIMETER WAVES Pub Date : 2010-06-21 DOI:10.1109/MSMW.2010.5545985

V. V. Meriakri, E. E. Chigray, I. P. Nikitin, L. Pan, R. Pan, M. Parkhomenko

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摘要

在文献[1]中，用n·CB (n = 5、6、7、8)同系列液晶(lc)在毫米波(MMW)范围内(频率50-70 GHz)的介电特性进行了测量。在这里，我们描述了测量这些特性的新方法，以及在波长约2毫米(频率从130到180 GHz)下实现该方法的实验装置。在0.6太赫兹频率下，用时域谱法对样品进行了分析。新方法采用设计在准光学方形金属介电波导上的迈克尔逊干涉仪(IM)，其截面为20 × 20 mm[2](图1)。

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Measurement of dielectric properties of liquid ctystals in the millimeter and THz ranges

In [1] the dielectric properties of liquid crystals (LCs) of homological series n·CB (n = 5, 6, 7, 8) were measured in the millimeter -wave (MMW) range (frequencies 50–70 GHz) using. Here we describe the new method for measuring these properties and an experimental setup that implements this method at wavelengths of about 2 mm (frequencies from 130 to 180 GHz). These samples were investigated also at frequency of 0.6 THz with help Time Domain Spectroscopy method. The new method employs the Michelson interferometer (IM) designed on a quasi-optic square metal-dielectric waveguide of cross section 20 × 20 mm [2] (Figure1).

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2010 INTERNATIONAL KHARKOV SYMPOSIUM ON PHYSICS AND ENGINEERING OF MICROWAVES, MILLIMETER AND SUBMILLIMETER WAVES

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