{"title":"VLSI系统设计工程师的测试教育","authors":"V. Agrawal","doi":"10.1109/IWV.1998.667117","DOIUrl":null,"url":null,"abstract":"The implementation of entire systems on VLSI chips provides an opportunity for a top-down test strategy. This is possible if the systems designer is familiar with the basic concepts in test, design for testability, and system diagnosis. The paper proposes a two-step education program. The first coarse, \"Essentials of Electronic Testing \", teaches the basic principles of testing. It is an undergraduate-level course and should be included in the core curriculum in addition to a VLSI design course. The second course, \"Advanced Concepts in VLSI Testing\", is a graduate-level course. It is useful for VLSI CAD engineers and for researchers.","PeriodicalId":185325,"journal":{"name":"Proceedings IEEE Computer Society Workshop on VLSI'98 System Level Design (Cat. No.98EX158)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Test education for VLSI systems design engineers\",\"authors\":\"V. Agrawal\",\"doi\":\"10.1109/IWV.1998.667117\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The implementation of entire systems on VLSI chips provides an opportunity for a top-down test strategy. This is possible if the systems designer is familiar with the basic concepts in test, design for testability, and system diagnosis. The paper proposes a two-step education program. The first coarse, \\\"Essentials of Electronic Testing \\\", teaches the basic principles of testing. It is an undergraduate-level course and should be included in the core curriculum in addition to a VLSI design course. The second course, \\\"Advanced Concepts in VLSI Testing\\\", is a graduate-level course. It is useful for VLSI CAD engineers and for researchers.\",\"PeriodicalId\":185325,\"journal\":{\"name\":\"Proceedings IEEE Computer Society Workshop on VLSI'98 System Level Design (Cat. No.98EX158)\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-04-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings IEEE Computer Society Workshop on VLSI'98 System Level Design (Cat. No.98EX158)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IWV.1998.667117\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings IEEE Computer Society Workshop on VLSI'98 System Level Design (Cat. No.98EX158)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IWV.1998.667117","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The implementation of entire systems on VLSI chips provides an opportunity for a top-down test strategy. This is possible if the systems designer is familiar with the basic concepts in test, design for testability, and system diagnosis. The paper proposes a two-step education program. The first coarse, "Essentials of Electronic Testing ", teaches the basic principles of testing. It is an undergraduate-level course and should be included in the core curriculum in addition to a VLSI design course. The second course, "Advanced Concepts in VLSI Testing", is a graduate-level course. It is useful for VLSI CAD engineers and for researchers.