{"title":"基于部分字典条目的重用测试数据压缩","authors":"Panagiotis Sismanoglou, D. Nikolos","doi":"10.1109/ICECS.2011.6122331","DOIUrl":null,"url":null,"abstract":"In this paper we show that the test data compression achieved by a dictionary based method can be improved significantly by suitably reusing parts of the dictionary entries. To this end two new algorithms are proposed, suitable for partial and complete dictionary coding respectively. The efficiency of the proposed techniques is supported with extensive simulation results.","PeriodicalId":251525,"journal":{"name":"2011 18th IEEE International Conference on Electronics, Circuits, and Systems","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Test data compression based on the reuse of parts of the dictionary entries\",\"authors\":\"Panagiotis Sismanoglou, D. Nikolos\",\"doi\":\"10.1109/ICECS.2011.6122331\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we show that the test data compression achieved by a dictionary based method can be improved significantly by suitably reusing parts of the dictionary entries. To this end two new algorithms are proposed, suitable for partial and complete dictionary coding respectively. The efficiency of the proposed techniques is supported with extensive simulation results.\",\"PeriodicalId\":251525,\"journal\":{\"name\":\"2011 18th IEEE International Conference on Electronics, Circuits, and Systems\",\"volume\":\"17 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 18th IEEE International Conference on Electronics, Circuits, and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICECS.2011.6122331\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 18th IEEE International Conference on Electronics, Circuits, and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICECS.2011.6122331","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Test data compression based on the reuse of parts of the dictionary entries
In this paper we show that the test data compression achieved by a dictionary based method can be improved significantly by suitably reusing parts of the dictionary entries. To this end two new algorithms are proposed, suitable for partial and complete dictionary coding respectively. The efficiency of the proposed techniques is supported with extensive simulation results.