{"title":"低频噪声频谱的测量及其参数的计算","authors":"Luo Tao, Xu Yong, Dai Yi-song, Shi Yaowu","doi":"10.1109/CICCAS.1991.184476","DOIUrl":null,"url":null,"abstract":"In this paper, a low-frequency noise spectrum testing system is presented, its measuring range is 0.25 Hz approximately 100 kHz, and accuracy is higher than 4%. Moreover, the white noise level and corner frequency are computed by applying the weighed least square method.<<ETX>>","PeriodicalId":119051,"journal":{"name":"China., 1991 International Conference on Circuits and Systems","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Measurement of low-frequency noise spectrum and computation of its parameters\",\"authors\":\"Luo Tao, Xu Yong, Dai Yi-song, Shi Yaowu\",\"doi\":\"10.1109/CICCAS.1991.184476\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a low-frequency noise spectrum testing system is presented, its measuring range is 0.25 Hz approximately 100 kHz, and accuracy is higher than 4%. Moreover, the white noise level and corner frequency are computed by applying the weighed least square method.<<ETX>>\",\"PeriodicalId\":119051,\"journal\":{\"name\":\"China., 1991 International Conference on Circuits and Systems\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1991-06-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"China., 1991 International Conference on Circuits and Systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CICCAS.1991.184476\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"China., 1991 International Conference on Circuits and Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICCAS.1991.184476","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Measurement of low-frequency noise spectrum and computation of its parameters
In this paper, a low-frequency noise spectrum testing system is presented, its measuring range is 0.25 Hz approximately 100 kHz, and accuracy is higher than 4%. Moreover, the white noise level and corner frequency are computed by applying the weighed least square method.<>