{"title":"微波波段片状介质εr和tgδ测量带线谐振器的设计","authors":"Dmitriy E. Minenko, Fedor I. Sheyerman","doi":"10.21293/1818-0442-2023-26-1-41-47","DOIUrl":null,"url":null,"abstract":"The development of stripline resonators in the problems of measuring the relative permittivity and the dielectric loss tangent of sheet dielectric materials in the microwave range is described. The results of measurements of the characteristics of the developed strip resonators are presented. The disadvantages and advantages of measuring equipment used in similar measurement methods are described.","PeriodicalId":273068,"journal":{"name":"Proceedings of Tomsk State University of Control Systems and Radioelectronics","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design of stripline resonators for measuring the εr and tgδ of sheet dielectric materials in the microwave range\",\"authors\":\"Dmitriy E. Minenko, Fedor I. Sheyerman\",\"doi\":\"10.21293/1818-0442-2023-26-1-41-47\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The development of stripline resonators in the problems of measuring the relative permittivity and the dielectric loss tangent of sheet dielectric materials in the microwave range is described. The results of measurements of the characteristics of the developed strip resonators are presented. The disadvantages and advantages of measuring equipment used in similar measurement methods are described.\",\"PeriodicalId\":273068,\"journal\":{\"name\":\"Proceedings of Tomsk State University of Control Systems and Radioelectronics\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of Tomsk State University of Control Systems and Radioelectronics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.21293/1818-0442-2023-26-1-41-47\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Tomsk State University of Control Systems and Radioelectronics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.21293/1818-0442-2023-26-1-41-47","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design of stripline resonators for measuring the εr and tgδ of sheet dielectric materials in the microwave range
The development of stripline resonators in the problems of measuring the relative permittivity and the dielectric loss tangent of sheet dielectric materials in the microwave range is described. The results of measurements of the characteristics of the developed strip resonators are presented. The disadvantages and advantages of measuring equipment used in similar measurement methods are described.
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