优化ESD电路保护器件的性能

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) Pub Date : 2000-09-26 DOI:10.1109/EOSESD.2000.890025

H. Hyatt, J. Harris, J. Colby, P. Bellew

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引用次数: 5

摘要

选择ESD电路保护的决策方法仍然知之甚少。选择通过ESD器件级测试的IC并不能保证使用该器件的特定电路能够在ESD事件中存活。我们提出了一种评估ESD电路保护的优化方法。

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Optimizing the performance of ESD circuit protection devices

Decision-making methods for choosing ESD circuit protection remain poorly understood. Selecting an IC which passed ESD device level testing does not guarantee that a particular circuit using that device will survive ESD events. We present an optimization methodology for assessment of ESD circuit protection.

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来源期刊

Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)

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