{"title":"重新进行二级测试并应用于NIST SP800-22","authors":"Fabio Pareschi, R. Rovatti, G. Setti","doi":"10.1109/ECCTD.2007.4529674","DOIUrl":null,"url":null,"abstract":"The use of second-level testing to reduce Type II errors in RNG validation was suggested from the very beginning though rarely employed in real-world cases. Yet, as security requirements become more critical and the availability of even faster RNG more commonplace, second-level testing will be key to distinguishing RNGs based on the quality of very large chunks of their output. This paper addresses some principles governing the proper design of second-level tests (i.e. how to divide available data into chunks and how to compute second-level p-values) as well as its implications on the design of the underlying basic tests.","PeriodicalId":445822,"journal":{"name":"2007 18th European Conference on Circuit Theory and Design","volume":"56 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Second-level testing revisited and applications to NIST SP800-22\",\"authors\":\"Fabio Pareschi, R. Rovatti, G. Setti\",\"doi\":\"10.1109/ECCTD.2007.4529674\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The use of second-level testing to reduce Type II errors in RNG validation was suggested from the very beginning though rarely employed in real-world cases. Yet, as security requirements become more critical and the availability of even faster RNG more commonplace, second-level testing will be key to distinguishing RNGs based on the quality of very large chunks of their output. This paper addresses some principles governing the proper design of second-level tests (i.e. how to divide available data into chunks and how to compute second-level p-values) as well as its implications on the design of the underlying basic tests.\",\"PeriodicalId\":445822,\"journal\":{\"name\":\"2007 18th European Conference on Circuit Theory and Design\",\"volume\":\"56 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 18th European Conference on Circuit Theory and Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECCTD.2007.4529674\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 18th European Conference on Circuit Theory and Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECCTD.2007.4529674","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Second-level testing revisited and applications to NIST SP800-22
The use of second-level testing to reduce Type II errors in RNG validation was suggested from the very beginning though rarely employed in real-world cases. Yet, as security requirements become more critical and the availability of even faster RNG more commonplace, second-level testing will be key to distinguishing RNGs based on the quality of very large chunks of their output. This paper addresses some principles governing the proper design of second-level tests (i.e. how to divide available data into chunks and how to compute second-level p-values) as well as its implications on the design of the underlying basic tests.