{"title":"基于局部均匀性和形态学图像处理的织物缺陷检测","authors":"A. Rebhi, S. Abid, F. Fnaiech","doi":"10.1109/IPAS.2016.7880062","DOIUrl":null,"url":null,"abstract":"In this paper, a new fabric detect detection algorithm based on local homogeneity and mathematical morphology is presented. In a first step, the local homogeneity of each pixel is computed to construct a new homogeneity image denoted as (H-image). Then a classical histogram is computed for the H-image to choose an optimal thresholding value to produce a corresponding binary image, which will be used to extract the optimal size and the shape of the Structuring Element (SE) for mathematical morphology. In a second step, the image is subjected to a series of morphological operations with this SE to detect the possible existing fabric defect. Simulation results exhibit accurate defect detection with low false alarms.","PeriodicalId":283737,"journal":{"name":"2016 International Image Processing, Applications and Systems (IPAS)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":"{\"title\":\"Fabric defect detection using local homogeneity and morphological image processing\",\"authors\":\"A. Rebhi, S. Abid, F. Fnaiech\",\"doi\":\"10.1109/IPAS.2016.7880062\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a new fabric detect detection algorithm based on local homogeneity and mathematical morphology is presented. In a first step, the local homogeneity of each pixel is computed to construct a new homogeneity image denoted as (H-image). Then a classical histogram is computed for the H-image to choose an optimal thresholding value to produce a corresponding binary image, which will be used to extract the optimal size and the shape of the Structuring Element (SE) for mathematical morphology. In a second step, the image is subjected to a series of morphological operations with this SE to detect the possible existing fabric defect. Simulation results exhibit accurate defect detection with low false alarms.\",\"PeriodicalId\":283737,\"journal\":{\"name\":\"2016 International Image Processing, Applications and Systems (IPAS)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"20\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 International Image Processing, Applications and Systems (IPAS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPAS.2016.7880062\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 International Image Processing, Applications and Systems (IPAS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPAS.2016.7880062","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fabric defect detection using local homogeneity and morphological image processing
In this paper, a new fabric detect detection algorithm based on local homogeneity and mathematical morphology is presented. In a first step, the local homogeneity of each pixel is computed to construct a new homogeneity image denoted as (H-image). Then a classical histogram is computed for the H-image to choose an optimal thresholding value to produce a corresponding binary image, which will be used to extract the optimal size and the shape of the Structuring Element (SE) for mathematical morphology. In a second step, the image is subjected to a series of morphological operations with this SE to detect the possible existing fabric defect. Simulation results exhibit accurate defect detection with low false alarms.