{"title":"可逆电路中三种故障模型的在线测试","authors":"Asif Nashiry, Gite Gaurav Bhaskar, J. Rice","doi":"10.1109/ISMVL.2015.36","DOIUrl":null,"url":null,"abstract":"In this paper we propose an approach for the design of online testable reversible circuits. A reversible circuit composed of Toffoli gates can be made online testable by adding two sets of CNOT gates and a single parity line. The performance of the proposed approach for detecting a single bit fault, a cross point fault and the family of missing gate faults has been observed. Discussion around the correctness of our approach and the overhead is also provided.","PeriodicalId":118417,"journal":{"name":"2015 IEEE International Symposium on Multiple-Valued Logic","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Online Testing for Three Fault Models in Reversible Circuits\",\"authors\":\"Asif Nashiry, Gite Gaurav Bhaskar, J. Rice\",\"doi\":\"10.1109/ISMVL.2015.36\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we propose an approach for the design of online testable reversible circuits. A reversible circuit composed of Toffoli gates can be made online testable by adding two sets of CNOT gates and a single parity line. The performance of the proposed approach for detecting a single bit fault, a cross point fault and the family of missing gate faults has been observed. Discussion around the correctness of our approach and the overhead is also provided.\",\"PeriodicalId\":118417,\"journal\":{\"name\":\"2015 IEEE International Symposium on Multiple-Valued Logic\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-05-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2015 IEEE International Symposium on Multiple-Valued Logic\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISMVL.2015.36\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Symposium on Multiple-Valued Logic","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISMVL.2015.36","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Online Testing for Three Fault Models in Reversible Circuits
In this paper we propose an approach for the design of online testable reversible circuits. A reversible circuit composed of Toffoli gates can be made online testable by adding two sets of CNOT gates and a single parity line. The performance of the proposed approach for detecting a single bit fault, a cross point fault and the family of missing gate faults has been observed. Discussion around the correctness of our approach and the overhead is also provided.
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