论TSD测量技术应用于PET薄膜热耐久性评估的可能性

Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics Pub Date : 1989-07-03 DOI:10.1109/ICSD.1989.69200

A. Gubanski, S. Gubanski

{"title":"论TSD测量技术应用于PET薄膜热耐久性评估的可能性","authors":"A. Gubanski, S. Gubanski","doi":"10.1109/ICSD.1989.69200","DOIUrl":null,"url":null,"abstract":"Experiments were conducted on samples of four types of PET (polyethylene terephthalate) film from two different manufacturers. The thermal aging of the PET films was shown to have a complex nature, expressed most markedly during the TSD measurements by changes of the space-charge peak maximum value. This behavior was found for all types of film. The peak change rate can be represented as a linear function of both the aging temperature and the expected time to withstand that thermal stress, estimated on the basis of the IEC 216 standard test. It is not possible at the present stage of study to estimate directly from the TSD measurements an equivalent to the temperature index, despite an existing correlation. Therefore, the method seems to be suitable for accelerated periodic monitoring of PET films whose thermal endurance characteristics are already known.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"447 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"On the possibility of the TSD measuring techniques application for PET films thermal endurance estimation\",\"authors\":\"A. Gubanski, S. Gubanski\",\"doi\":\"10.1109/ICSD.1989.69200\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Experiments were conducted on samples of four types of PET (polyethylene terephthalate) film from two different manufacturers. The thermal aging of the PET films was shown to have a complex nature, expressed most markedly during the TSD measurements by changes of the space-charge peak maximum value. This behavior was found for all types of film. The peak change rate can be represented as a linear function of both the aging temperature and the expected time to withstand that thermal stress, estimated on the basis of the IEC 216 standard test. It is not possible at the present stage of study to estimate directly from the TSD measurements an equivalent to the temperature index, despite an existing correlation. Therefore, the method seems to be suitable for accelerated periodic monitoring of PET films whose thermal endurance characteristics are already known.<<ETX>>\",\"PeriodicalId\":184126,\"journal\":{\"name\":\"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics\",\"volume\":\"447 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-07-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSD.1989.69200\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSD.1989.69200","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 2

摘要

对来自两个不同厂家的四种PET(聚对苯二甲酸乙二醇酯)薄膜样品进行了实验。PET薄膜的热老化具有复杂的性质，在TSD测量中以空间电荷峰最大值的变化表现得最为明显。在所有类型的电影中都发现了这种行为。峰值变化率可以表示为老化温度和承受该热应力的预期时间的线性函数，这是根据IEC 216标准测试估计的。在目前的研究阶段，不可能直接从TSD测量中估计出与温度指数相当的值，尽管存在相关性。因此，该方法似乎适用于已知热耐久特性的PET薄膜的加速周期性监测。

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On the possibility of the TSD measuring techniques application for PET films thermal endurance estimation

Experiments were conducted on samples of four types of PET (polyethylene terephthalate) film from two different manufacturers. The thermal aging of the PET films was shown to have a complex nature, expressed most markedly during the TSD measurements by changes of the space-charge peak maximum value. This behavior was found for all types of film. The peak change rate can be represented as a linear function of both the aging temperature and the expected time to withstand that thermal stress, estimated on the basis of the IEC 216 standard test. It is not possible at the present stage of study to estimate directly from the TSD measurements an equivalent to the temperature index, despite an existing correlation. Therefore, the method seems to be suitable for accelerated periodic monitoring of PET films whose thermal endurance characteristics are already known.<>

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Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics

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