CMOS焦平面空间过采样计算图像传感器

{"title":"CMOS焦平面空间过采样计算图像传感器","authors":"A. Olyaei, R. Genov","doi":"10.1201/9781420070637.CH27","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":447843,"journal":{"name":"Circuits at the Nanoscale","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"CMOS Focal Plane Spatially Oversampling Computational Image Sensor\",\"authors\":\"A. Olyaei, R. Genov\",\"doi\":\"10.1201/9781420070637.CH27\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":447843,\"journal\":{\"name\":\"Circuits at the Nanoscale\",\"volume\":\"21 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-09-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Circuits at the Nanoscale\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1201/9781420070637.CH27\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Circuits at the Nanoscale","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1201/9781420070637.CH27","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}