混合信号电路测试综述

Proceedings of Third International Conference on Electronics, Circuits, and Systems Pub Date : 1996-10-13 DOI:10.1109/ICECS.1996.584604

C. Wey

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引用次数: 10

摘要

测试和故障诊断是混合信号电路设计和维护中的两个重要方面。为了提高数字电路的可测试性和故障诊断性，可测试性设计(DFT)和内置自检(BIST)技术已被成功地应用于数字电路。本文回顾了这些技术在模拟电路中的发展，并讨论了故障诊断和测试方面的未来挑战。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Mixed-signal circuit testing-A review

Testing and fault diagnosis are two important aspects in the design and maintenance of mixed-signal circuits. To enhance testability and fault diagnosability, both design-for-testability (DFT) and built-in self-test (BIST) techniques have been successfully developed for digital circuits. This paper reviews the development of these techniques in analog circuits and discusses the future challenges in both fault diagnosis and testing.

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Proceedings of Third International Conference on Electronics, Circuits, and Systems

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