石英上rac型啁啾线的幅相位补偿

A. Rønnekleiv
{"title":"石英上rac型啁啾线的幅相位补偿","authors":"A. Rønnekleiv","doi":"10.1109/ULTSYM.1988.49363","DOIUrl":null,"url":null,"abstract":"A novel method for correction of the amplitude and phase response of RAC (reflecting array pulse compressor)-type chirp lines on quartz is demonstrated. The corrections are obtained through normal or reactive RF sputter etching of the lines through a moving slit. For amplitude correction the material selectivity of reactive sputter etching is used to correct the groove depth after initial fabrication of the lines. A thin Cr film, left in place in the finished line, is used as an etching mask. Phase correction is done by sputtering off gold from a gold line between the two arrays. Using this method a Kaiser-Bessel weighted line with a chirp rate of 0.0576 MHz/ mu s and 120- mu s dispersive delay was made, and weighted RMS (root mean square) amplitude and phase errors of 0.086 dB and 0.45 degrees were obtained.<<ETX>>","PeriodicalId":263198,"journal":{"name":"IEEE 1988 Ultrasonics Symposium Proceedings.","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Amplitude and phase compensation of RAC-type chirp lines on quartz\",\"authors\":\"A. Rønnekleiv\",\"doi\":\"10.1109/ULTSYM.1988.49363\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel method for correction of the amplitude and phase response of RAC (reflecting array pulse compressor)-type chirp lines on quartz is demonstrated. The corrections are obtained through normal or reactive RF sputter etching of the lines through a moving slit. For amplitude correction the material selectivity of reactive sputter etching is used to correct the groove depth after initial fabrication of the lines. A thin Cr film, left in place in the finished line, is used as an etching mask. Phase correction is done by sputtering off gold from a gold line between the two arrays. Using this method a Kaiser-Bessel weighted line with a chirp rate of 0.0576 MHz/ mu s and 120- mu s dispersive delay was made, and weighted RMS (root mean square) amplitude and phase errors of 0.086 dB and 0.45 degrees were obtained.<<ETX>>\",\"PeriodicalId\":263198,\"journal\":{\"name\":\"IEEE 1988 Ultrasonics Symposium Proceedings.\",\"volume\":\"30 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 1988 Ultrasonics Symposium Proceedings.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ULTSYM.1988.49363\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 1988 Ultrasonics Symposium Proceedings.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ULTSYM.1988.49363","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

摘要

提出了一种校正石英反射阵脉冲压缩器(RAC)型啁啾线幅相响应的新方法。通过移动狭缝对线进行正常或反应性射频溅射刻蚀,获得校正。对于振幅校正,采用反应溅射蚀刻的材料选择性来校正线的初始制作后的凹槽深度。在成品线上留下一层薄薄的铬膜,用作蚀刻掩膜。相位校正是通过从两个阵列之间的金线溅射金来完成的。利用该方法制备了啁啾率为0.0576 MHz/ μ s、色散延迟为120 μ s的Kaiser-Bessel加权线,得到的加权均方根幅值和相位误差分别为0.086 dB和0.45°。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Amplitude and phase compensation of RAC-type chirp lines on quartz
A novel method for correction of the amplitude and phase response of RAC (reflecting array pulse compressor)-type chirp lines on quartz is demonstrated. The corrections are obtained through normal or reactive RF sputter etching of the lines through a moving slit. For amplitude correction the material selectivity of reactive sputter etching is used to correct the groove depth after initial fabrication of the lines. A thin Cr film, left in place in the finished line, is used as an etching mask. Phase correction is done by sputtering off gold from a gold line between the two arrays. Using this method a Kaiser-Bessel weighted line with a chirp rate of 0.0576 MHz/ mu s and 120- mu s dispersive delay was made, and weighted RMS (root mean square) amplitude and phase errors of 0.086 dB and 0.45 degrees were obtained.<>
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信