电子工艺产量有限

Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525) Pub Date : 2000-03-20 DOI:10.1109/ISQED.2000.838924

G. Maier, Shawn Smith

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引用次数: 5

摘要

今天的工业正在将高性能微处理器市场扩展到消费市场。这个市场需要非常低的成本、高可靠性、更严格的SPQL标准和非常高的产量。需要一种新的诊断方法来满足这些新的需求。本文讨论了从产品设计和制造测试到诊断和数据分析工具的广泛问题。它描述了当前在IBM最新的采用铜和SOI技术的PowerPC产品上运行的一个beta测试用例。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Electronic process limited yield

Today's industry is expanding the high performance microprocessor market into the consumer market place. This market requires very low cost, high reliability, stricter SPQL levels, and very high yields. A New Diagnostic Methodology is required to meet these new demands. This paper addresses a broad scope of issues from Product Design and Manufacturing Test, to Diagnostic and Data Analysis Tools. It describes a beta test case currently in operation on IBM's latest PowerPC products in their copper and SOI technologies.

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来源期刊

Proceedings IEEE 2000 First International Symposium on Quality Electronic Design (Cat. No. PR00525)

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