{"title":"白光干涉表面轮廓中光谱成像干涉数据抖动-压缩感知联合处理的重建稳定性及局限性研究","authors":"C. Taudt, Sophie Gruner, P. Hartmann","doi":"10.1117/12.2649589","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":210624,"journal":{"name":"Photonic Instrumentation Engineering X","volume":"57 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-03-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Investigation of reconstruction stability and limitations for combined dithering-compressed-sensing processing of spectral imaging interferometric data in white-light interferometric surface profiling\",\"authors\":\"C. Taudt, Sophie Gruner, P. Hartmann\",\"doi\":\"10.1117/12.2649589\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":210624,\"journal\":{\"name\":\"Photonic Instrumentation Engineering X\",\"volume\":\"57 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-03-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Photonic Instrumentation Engineering X\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1117/12.2649589\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Photonic Instrumentation Engineering X","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2649589","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Investigation of reconstruction stability and limitations for combined dithering-compressed-sensing processing of spectral imaging interferometric data in white-light interferometric surface profiling