一种硬件效率为0.13μm的基于概率的容噪电路设计与实现,抗噪能力提高24.5dB

I-Chyn Wey, You-Gang Chen, Changhong Yu, Jie Chen, A. Wu
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引用次数: 10

摘要

随着CMOS器件的尺寸缩小到纳米级,噪声干扰开始显著影响VLSI电路的性能。由于噪声具有随机性和动态性,因此基于概率的方法比传统的确定性电路设计更适合处理信号误差。然而,基于概率的设计需要更大的硬件面积。在本文中,我们设计并实现了一个硬件高效的基于概率的容噪电路,一个8位马尔可夫随机场进位前向加法器(MRF_CLA),在0.13 m CMOS工艺技术。测量结果表明,与传统CMOS设计相比,MRF_CLA的抗噪能力提高了24.5 dB。此外,与最先进的MRF设计相比,晶体管数量可以节省42%[1]。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A 0.13μm hardware-efficient probabilistic-based noise-tolerant circuit design and implementation with 24.5dB noise-immunity improvement
As the size of CMOS devices is scaled down to the nanoscale level, noise interferences start to significantly affect the VLSI circuit performance. Because the noise is random and dynamic in nature, a probabilistic-based approach is more suitable to handle signal errors than the conventional deterministic circuit designs. However, probabilistic-based designs cost larger hardware area. In this paper, we design and implement a hardware-efficient probabilistic-based noise-tolerant circuit, an 8-bit Markov random field carry lookahead adder (MRF_CLA), in 0.13 mum CMOS process technology. The measurement results show that the proposed MRF_CLA can provide 24.5 dB of noise-immunity enhancement as compared with its conventional CMOS design. Moreover, the transistor count can be saved 42% as compared to the state-of-art MRF design [1].
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