探索应用于新光伏技术的诊断能力

E. Quintana, M. Quintana, Kevin D. Rolfe, K. Thompson, P. Hacke
{"title":"探索应用于新光伏技术的诊断能力","authors":"E. Quintana, M. Quintana, Kevin D. Rolfe, K. Thompson, P. Hacke","doi":"10.1109/PVSC.2009.5411471","DOIUrl":null,"url":null,"abstract":"Explosive growth in photovoltaic markets has fueled new creative approaches that promise to cut costs and improve reliability of system components. However, market demands require rapid development of these new and innovative technologies in order to compete with more established products and capture market share. Oftentimes diagnostics that assist in R&D do not exist or have not been applied due to the innovative nature of the proposed products. Some diagnostics such as IR imaging, electroluminescence, light IV, dark IV, x-rays, and ultrasound have been employed in the past and continue to serve in development of new products, however, innovative products with new materials, unique geometries, and previously unused manufacturing processes require additional or improved test capabilities. This fast-track product development cycle requires diagnostic capabilities to provide the information that confirms the integrity of manufacturing techniques and provides the feedback that can spawn confidence in process control, reliability and performance. This paper explores the use of digital radiography and computed tomography (CT) with other diagnostics to support photovoltaic R&D and manufacturing applications.","PeriodicalId":411472,"journal":{"name":"2009 34th IEEE Photovoltaic Specialists Conference (PVSC)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"14","resultStr":"{\"title\":\"Exploring diagnostic capabilities for application to new photovoltaic technologies\",\"authors\":\"E. Quintana, M. Quintana, Kevin D. Rolfe, K. Thompson, P. Hacke\",\"doi\":\"10.1109/PVSC.2009.5411471\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Explosive growth in photovoltaic markets has fueled new creative approaches that promise to cut costs and improve reliability of system components. However, market demands require rapid development of these new and innovative technologies in order to compete with more established products and capture market share. Oftentimes diagnostics that assist in R&D do not exist or have not been applied due to the innovative nature of the proposed products. Some diagnostics such as IR imaging, electroluminescence, light IV, dark IV, x-rays, and ultrasound have been employed in the past and continue to serve in development of new products, however, innovative products with new materials, unique geometries, and previously unused manufacturing processes require additional or improved test capabilities. This fast-track product development cycle requires diagnostic capabilities to provide the information that confirms the integrity of manufacturing techniques and provides the feedback that can spawn confidence in process control, reliability and performance. This paper explores the use of digital radiography and computed tomography (CT) with other diagnostics to support photovoltaic R&D and manufacturing applications.\",\"PeriodicalId\":411472,\"journal\":{\"name\":\"2009 34th IEEE Photovoltaic Specialists Conference (PVSC)\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2009-06-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"14\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2009 34th IEEE Photovoltaic Specialists Conference (PVSC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PVSC.2009.5411471\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 34th IEEE Photovoltaic Specialists Conference (PVSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.2009.5411471","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 14

摘要

光伏市场的爆炸性增长催生了新的创新方法,有望降低成本并提高系统组件的可靠性。然而,市场需求要求这些新的创新技术迅速发展,以便与更成熟的产品竞争并获得市场份额。通常,由于拟议产品的创新性质,协助研发的诊断不存在或尚未应用。一些诊断方法,如红外成像、电发光、光IV、暗IV、x射线和超声波,过去已被采用,并继续用于新产品的开发,然而,具有新材料、独特几何形状和以前未使用的制造工艺的创新产品需要额外或改进的测试能力。这种快速的产品开发周期需要诊断能力,以提供确认制造技术完整性的信息,并提供反馈,从而产生对过程控制、可靠性和性能的信心。本文探讨了数字放射照相和计算机断层扫描(CT)与其他诊断的使用,以支持光伏研发和制造应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Exploring diagnostic capabilities for application to new photovoltaic technologies
Explosive growth in photovoltaic markets has fueled new creative approaches that promise to cut costs and improve reliability of system components. However, market demands require rapid development of these new and innovative technologies in order to compete with more established products and capture market share. Oftentimes diagnostics that assist in R&D do not exist or have not been applied due to the innovative nature of the proposed products. Some diagnostics such as IR imaging, electroluminescence, light IV, dark IV, x-rays, and ultrasound have been employed in the past and continue to serve in development of new products, however, innovative products with new materials, unique geometries, and previously unused manufacturing processes require additional or improved test capabilities. This fast-track product development cycle requires diagnostic capabilities to provide the information that confirms the integrity of manufacturing techniques and provides the feedback that can spawn confidence in process control, reliability and performance. This paper explores the use of digital radiography and computed tomography (CT) with other diagnostics to support photovoltaic R&D and manufacturing applications.
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