{"title":"具有共振侧漏的薄、浅脊绝缘体上硅波导中极化依赖的散射损耗","authors":"T. Nguyen, A. Mitchell","doi":"10.1109/ACOFT.2010.5929934","DOIUrl":null,"url":null,"abstract":"We present an analysis of the polarisation dependent scattering loss due to surface and sidewall roughness in thin, shallow-ridge silicon-on-insulator (SOT) waveguides using three dimensional coupled mode theory. The impact on resonant lateral leakage is discussed.","PeriodicalId":338472,"journal":{"name":"35th Australian Conference on Optical Fibre Technology","volume":"64 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Polarisation dependent scattering loss in thin, shallow-ridge silicon-on-insulator waveguides with resonant lateral leakage\",\"authors\":\"T. Nguyen, A. Mitchell\",\"doi\":\"10.1109/ACOFT.2010.5929934\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present an analysis of the polarisation dependent scattering loss due to surface and sidewall roughness in thin, shallow-ridge silicon-on-insulator (SOT) waveguides using three dimensional coupled mode theory. The impact on resonant lateral leakage is discussed.\",\"PeriodicalId\":338472,\"journal\":{\"name\":\"35th Australian Conference on Optical Fibre Technology\",\"volume\":\"64 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"35th Australian Conference on Optical Fibre Technology\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ACOFT.2010.5929934\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"35th Australian Conference on Optical Fibre Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ACOFT.2010.5929934","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Polarisation dependent scattering loss in thin, shallow-ridge silicon-on-insulator waveguides with resonant lateral leakage
We present an analysis of the polarisation dependent scattering loss due to surface and sidewall roughness in thin, shallow-ridge silicon-on-insulator (SOT) waveguides using three dimensional coupled mode theory. The impact on resonant lateral leakage is discussed.
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