M. Mohamad, F. Mustafa, M. Abidin, S. Rahman, N. K. Al-Obaidi, A. M. Hashim, A. Aziz, M. Hashim
{"title":"利用未掺杂algan /GaN HEMT的氢气传感器的传感性能","authors":"M. Mohamad, F. Mustafa, M. Abidin, S. Rahman, N. K. Al-Obaidi, A. M. Hashim, A. Aziz, M. Hashim","doi":"10.3923/JAS.2010.1797.1801","DOIUrl":null,"url":null,"abstract":"The response of Pt-circular Schottky diodes fabricated on undoped AlGaN/GaN high-electron-mobility-transistor (HEMT) structure to hydrogen gas at various temperatures, ranging from 25°C to 200°C has been investigated. A 5 nm-thick of catalytic Pt Shottky contact is formed by electron beam evaporation. Both forward and reverse currents of the device increase upon exposing to hydrogen gas. Although a slight change of forward and reverse current is obtained at room temperature upon exposure to hydrogen but both currents drastically increase with the increase of temperatures. The time-transient characteristics show the average current increment and decrement speed of 27.6 nA/sec and 17.6 nA/sec, respectively at constant forward bias of 1V and temperature of 200°C.","PeriodicalId":308501,"journal":{"name":"2010 IEEE International Conference on Semiconductor Electronics (ICSE2010)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-07-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"The sensing performance of hydrogen gas sensor utilizing undoped-AlGaN/GaN HEMT\",\"authors\":\"M. Mohamad, F. Mustafa, M. Abidin, S. Rahman, N. K. Al-Obaidi, A. M. Hashim, A. Aziz, M. Hashim\",\"doi\":\"10.3923/JAS.2010.1797.1801\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The response of Pt-circular Schottky diodes fabricated on undoped AlGaN/GaN high-electron-mobility-transistor (HEMT) structure to hydrogen gas at various temperatures, ranging from 25°C to 200°C has been investigated. A 5 nm-thick of catalytic Pt Shottky contact is formed by electron beam evaporation. Both forward and reverse currents of the device increase upon exposing to hydrogen gas. Although a slight change of forward and reverse current is obtained at room temperature upon exposure to hydrogen but both currents drastically increase with the increase of temperatures. The time-transient characteristics show the average current increment and decrement speed of 27.6 nA/sec and 17.6 nA/sec, respectively at constant forward bias of 1V and temperature of 200°C.\",\"PeriodicalId\":308501,\"journal\":{\"name\":\"2010 IEEE International Conference on Semiconductor Electronics (ICSE2010)\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-07-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE International Conference on Semiconductor Electronics (ICSE2010)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.3923/JAS.2010.1797.1801\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Conference on Semiconductor Electronics (ICSE2010)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.3923/JAS.2010.1797.1801","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The sensing performance of hydrogen gas sensor utilizing undoped-AlGaN/GaN HEMT
The response of Pt-circular Schottky diodes fabricated on undoped AlGaN/GaN high-electron-mobility-transistor (HEMT) structure to hydrogen gas at various temperatures, ranging from 25°C to 200°C has been investigated. A 5 nm-thick of catalytic Pt Shottky contact is formed by electron beam evaporation. Both forward and reverse currents of the device increase upon exposing to hydrogen gas. Although a slight change of forward and reverse current is obtained at room temperature upon exposure to hydrogen but both currents drastically increase with the increase of temperatures. The time-transient characteristics show the average current increment and decrement speed of 27.6 nA/sec and 17.6 nA/sec, respectively at constant forward bias of 1V and temperature of 200°C.