M. Borsero, Claudio Pravato, A. Sona, M. Stellini, A. Zuccato
{"title":"改进的适配器,用于精确校准LISN输入阻抗","authors":"M. Borsero, Claudio Pravato, A. Sona, M. Stellini, A. Zuccato","doi":"10.1109/EMCZUR.2007.4388302","DOIUrl":null,"url":null,"abstract":"The paper deals with the accurate calibration of LISN impedance at the EUT port, focusing on the effects of parasitic parameters at the EUT side and their effects on calibration. The goal is to improve the calibration accuracy and repeatability by adopting a standardized external adapter, used to connect the measurement system to the LISN. Different models are analysed, both theoretically and experimentally, through meaningful experimental examples.","PeriodicalId":397061,"journal":{"name":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Improved adapters for the accurate calibration of LISN input impedance\",\"authors\":\"M. Borsero, Claudio Pravato, A. Sona, M. Stellini, A. Zuccato\",\"doi\":\"10.1109/EMCZUR.2007.4388302\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper deals with the accurate calibration of LISN impedance at the EUT port, focusing on the effects of parasitic parameters at the EUT side and their effects on calibration. The goal is to improve the calibration accuracy and repeatability by adopting a standardized external adapter, used to connect the measurement system to the LISN. Different models are analysed, both theoretically and experimentally, through meaningful experimental examples.\",\"PeriodicalId\":397061,\"journal\":{\"name\":\"2007 18th International Zurich Symposium on Electromagnetic Compatibility\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-11-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 18th International Zurich Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCZUR.2007.4388302\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 18th International Zurich Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCZUR.2007.4388302","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Improved adapters for the accurate calibration of LISN input impedance
The paper deals with the accurate calibration of LISN impedance at the EUT port, focusing on the effects of parasitic parameters at the EUT side and their effects on calibration. The goal is to improve the calibration accuracy and repeatability by adopting a standardized external adapter, used to connect the measurement system to the LISN. Different models are analysed, both theoretically and experimentally, through meaningful experimental examples.