F. de Paulis, Biyao Zhao, S. Piersanti, Jonghyun Cho, R. Cecchetti, B. Achkir, A. Orlandi, J. Fan
{"title":"芯片和中间体PDN对高速信道眼图的影响","authors":"F. de Paulis, Biyao Zhao, S. Piersanti, Jonghyun Cho, R. Cecchetti, B. Achkir, A. Orlandi, J. Fan","doi":"10.1109/SAPIW.2018.8401673","DOIUrl":null,"url":null,"abstract":"The paper applies the combined SI-PI co-simulation to on chip high speed interconnects. A complete model of chip and interposer PDN is developed and, together to a lumped model of the PCB and package PDN, it is employed to supply I/O drivers for HBM traces laid out on silicon interposer. A comprehensive analysis is carried out highlighting the impact of the decoupling capacitor placement and their corresponding parasitic inductance on the supply voltage ripple and on the output eye diagram at the signal receivers.","PeriodicalId":423850,"journal":{"name":"2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Impact of chip and interposer PDN to eye diagram in high speed channels\",\"authors\":\"F. de Paulis, Biyao Zhao, S. Piersanti, Jonghyun Cho, R. Cecchetti, B. Achkir, A. Orlandi, J. Fan\",\"doi\":\"10.1109/SAPIW.2018.8401673\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper applies the combined SI-PI co-simulation to on chip high speed interconnects. A complete model of chip and interposer PDN is developed and, together to a lumped model of the PCB and package PDN, it is employed to supply I/O drivers for HBM traces laid out on silicon interposer. A comprehensive analysis is carried out highlighting the impact of the decoupling capacitor placement and their corresponding parasitic inductance on the supply voltage ripple and on the output eye diagram at the signal receivers.\",\"PeriodicalId\":423850,\"journal\":{\"name\":\"2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI)\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-05-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/SAPIW.2018.8401673\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 22nd Workshop on Signal and Power Integrity (SPI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SAPIW.2018.8401673","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Impact of chip and interposer PDN to eye diagram in high speed channels
The paper applies the combined SI-PI co-simulation to on chip high speed interconnects. A complete model of chip and interposer PDN is developed and, together to a lumped model of the PCB and package PDN, it is employed to supply I/O drivers for HBM traces laid out on silicon interposer. A comprehensive analysis is carried out highlighting the impact of the decoupling capacitor placement and their corresponding parasitic inductance on the supply voltage ripple and on the output eye diagram at the signal receivers.