{"title":"探讨将电缆信息组合成近场数据进行远场估计的不同方法","authors":"K. Kam, A. Radchenko, D. Pommerenke","doi":"10.1109/ISEMC.2012.6351767","DOIUrl":null,"url":null,"abstract":"Near-field scanning is often used to solve EMC problems. Aside from the purpose of visualization of near-fields, measured near-field data can be used to estimate far-field. One of many challenges associated with using near-field to far-field transform (NFFFT) technique for EMC application is the handling of attached cables. The objective of this investigation is to evaluate different methods to add cable information to the near-field data for far-field estimation. The investigation is carried out using numerical experiments in EMCoS EMC studio, which is a commercial MoM (Method of Moment) tool for EM simulation. Measurement results from a test structure are also presented to validate the simulation results.","PeriodicalId":197346,"journal":{"name":"2012 IEEE International Symposium on Electromagnetic Compatibility","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"On different methods to combine cable information into near-field data for far-field estimation\",\"authors\":\"K. Kam, A. Radchenko, D. Pommerenke\",\"doi\":\"10.1109/ISEMC.2012.6351767\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Near-field scanning is often used to solve EMC problems. Aside from the purpose of visualization of near-fields, measured near-field data can be used to estimate far-field. One of many challenges associated with using near-field to far-field transform (NFFFT) technique for EMC application is the handling of attached cables. The objective of this investigation is to evaluate different methods to add cable information to the near-field data for far-field estimation. The investigation is carried out using numerical experiments in EMCoS EMC studio, which is a commercial MoM (Method of Moment) tool for EM simulation. Measurement results from a test structure are also presented to validate the simulation results.\",\"PeriodicalId\":197346,\"journal\":{\"name\":\"2012 IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"48 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-11-12\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.2012.6351767\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2012.6351767","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On different methods to combine cable information into near-field data for far-field estimation
Near-field scanning is often used to solve EMC problems. Aside from the purpose of visualization of near-fields, measured near-field data can be used to estimate far-field. One of many challenges associated with using near-field to far-field transform (NFFFT) technique for EMC application is the handling of attached cables. The objective of this investigation is to evaluate different methods to add cable information to the near-field data for far-field estimation. The investigation is carried out using numerical experiments in EMCoS EMC studio, which is a commercial MoM (Method of Moment) tool for EM simulation. Measurement results from a test structure are also presented to validate the simulation results.