J. Driesen, Clécio Fischer, Guilherme L. Caselato de Sousa, O. Santos, R. Loendersloot, D. Rade, Cristiane Aparecida Martins, L. Góes
{"title":"形状记忆合金导线的Labview/Arduino测量系统","authors":"J. Driesen, Clécio Fischer, Guilherme L. Caselato de Sousa, O. Santos, R. Loendersloot, D. Rade, Cristiane Aparecida Martins, L. Góes","doi":"10.1109/INDUSCON.2018.8627164","DOIUrl":null,"url":null,"abstract":"Shape memory alloy (SMA) wires have extensive use in many areas of the industry nowadays and its development continues reaching new applications as studies progress. This paper proposes a SMA measurement device that uses affordable components, such as the Arduino micro-controller and a LabVIEW programming language interface. With an antagonistic mechanism design, data on temperature, strain and stress is acquired to confirm the measuring capabilities of the full equipped instrument, rendering visualizations of phase transformations and opening way for further development in control and detailed acquisition of shape memory alloy wire properties.","PeriodicalId":156866,"journal":{"name":"2018 13th IEEE International Conference on Industry Applications (INDUSCON)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A Labview/Arduino Measurement System for Shape Memory Alloy Wires\",\"authors\":\"J. Driesen, Clécio Fischer, Guilherme L. Caselato de Sousa, O. Santos, R. Loendersloot, D. Rade, Cristiane Aparecida Martins, L. Góes\",\"doi\":\"10.1109/INDUSCON.2018.8627164\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Shape memory alloy (SMA) wires have extensive use in many areas of the industry nowadays and its development continues reaching new applications as studies progress. This paper proposes a SMA measurement device that uses affordable components, such as the Arduino micro-controller and a LabVIEW programming language interface. With an antagonistic mechanism design, data on temperature, strain and stress is acquired to confirm the measuring capabilities of the full equipped instrument, rendering visualizations of phase transformations and opening way for further development in control and detailed acquisition of shape memory alloy wire properties.\",\"PeriodicalId\":156866,\"journal\":{\"name\":\"2018 13th IEEE International Conference on Industry Applications (INDUSCON)\",\"volume\":\"9 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 13th IEEE International Conference on Industry Applications (INDUSCON)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/INDUSCON.2018.8627164\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 13th IEEE International Conference on Industry Applications (INDUSCON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INDUSCON.2018.8627164","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Labview/Arduino Measurement System for Shape Memory Alloy Wires
Shape memory alloy (SMA) wires have extensive use in many areas of the industry nowadays and its development continues reaching new applications as studies progress. This paper proposes a SMA measurement device that uses affordable components, such as the Arduino micro-controller and a LabVIEW programming language interface. With an antagonistic mechanism design, data on temperature, strain and stress is acquired to confirm the measuring capabilities of the full equipped instrument, rendering visualizations of phase transformations and opening way for further development in control and detailed acquisition of shape memory alloy wire properties.