Thomas Gougeon, Morgan Barbier, Patrick Lacharme, Gildas Avoine, C. Rosenberger
{"title":"在智能卡转储中检索日期就像大海捞针一样困难","authors":"Thomas Gougeon, Morgan Barbier, Patrick Lacharme, Gildas Avoine, C. Rosenberger","doi":"10.1109/WIFS.2017.8267663","DOIUrl":null,"url":null,"abstract":"This paper introduces a method to automatically retrieve dates from smart card memory dumps when the card specifications are unknown. It exploits specificities of smart cards, using a multi-dump analysis augmented with contextual information. The experiments performed on more than 180 real smart cards show that our method is highly successful in removing false positives.","PeriodicalId":305837,"journal":{"name":"2017 IEEE Workshop on Information Forensics and Security (WIFS)","volume":"113 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Retrieving dates in smart card dumps is as hard as finding a needle in a haystack\",\"authors\":\"Thomas Gougeon, Morgan Barbier, Patrick Lacharme, Gildas Avoine, C. Rosenberger\",\"doi\":\"10.1109/WIFS.2017.8267663\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper introduces a method to automatically retrieve dates from smart card memory dumps when the card specifications are unknown. It exploits specificities of smart cards, using a multi-dump analysis augmented with contextual information. The experiments performed on more than 180 real smart cards show that our method is highly successful in removing false positives.\",\"PeriodicalId\":305837,\"journal\":{\"name\":\"2017 IEEE Workshop on Information Forensics and Security (WIFS)\",\"volume\":\"113 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-12-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 IEEE Workshop on Information Forensics and Security (WIFS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/WIFS.2017.8267663\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE Workshop on Information Forensics and Security (WIFS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WIFS.2017.8267663","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Retrieving dates in smart card dumps is as hard as finding a needle in a haystack
This paper introduces a method to automatically retrieve dates from smart card memory dumps when the card specifications are unknown. It exploits specificities of smart cards, using a multi-dump analysis augmented with contextual information. The experiments performed on more than 180 real smart cards show that our method is highly successful in removing false positives.