朝着理解无麻烦发现装置的方向前进

23rd IEEE VLSI Test Symposium (VTS'05) Pub Date : 2005-05-01 DOI:10.1109/VTS.2005.86

Scott Davidson

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引用次数: 23

摘要

本文给出了一个理解无故障发现(NTF)部件的模型，包括预测在产品生命周期的不同阶段预计会有多少故障，理解什么时候需要关注NTF，以及什么时候应该预期它们。我们还展示了如何将NTF率用作过程运行状况的度量。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Towards an understanding of no trouble found devices

This paper gives a model for understanding no trouble found (NTF) parts, including predictions of how many can be expected at different stages of a product life cycle, an understanding of when NTFs are of concern, and when they are to be expected. We also show how NTF rates can be used as a measure of process health.

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23rd IEEE VLSI Test Symposium (VTS'05)

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