{"title":"通过阻抗减小和动态电压调度方案实现保护带最小化","authors":"Amit KumarJain, Sameer Shekhar, Chin LeeKuan","doi":"10.1109/EPEPS.2018.8534272","DOIUrl":null,"url":null,"abstract":"Voltage guard bands required to safeguard against load transient induced voltage undershoots result in power and performance penalties for high performance CPUs. This paper presents design techniques for impedance minimization and framework to dynamically alter sense and reference voltages based on information about distributed impedance, silicon speed, and scheduled load activity. Studies show guard band reduction by several tens of mV.","PeriodicalId":403235,"journal":{"name":"2018 IEEE 27th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Guard Band Minimization via Impedance Reduction and Dynamic Voltage Scheduling Schemes\",\"authors\":\"Amit KumarJain, Sameer Shekhar, Chin LeeKuan\",\"doi\":\"10.1109/EPEPS.2018.8534272\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Voltage guard bands required to safeguard against load transient induced voltage undershoots result in power and performance penalties for high performance CPUs. This paper presents design techniques for impedance minimization and framework to dynamically alter sense and reference voltages based on information about distributed impedance, silicon speed, and scheduled load activity. Studies show guard band reduction by several tens of mV.\",\"PeriodicalId\":403235,\"journal\":{\"name\":\"2018 IEEE 27th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)\",\"volume\":\"48 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE 27th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEPS.2018.8534272\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE 27th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEPS.2018.8534272","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Guard Band Minimization via Impedance Reduction and Dynamic Voltage Scheduling Schemes
Voltage guard bands required to safeguard against load transient induced voltage undershoots result in power and performance penalties for high performance CPUs. This paper presents design techniques for impedance minimization and framework to dynamically alter sense and reference voltages based on information about distributed impedance, silicon speed, and scheduled load activity. Studies show guard band reduction by several tens of mV.